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TOFSIMS investigation of ZrAlO oxide layers

dc.contributor.authorConard, Thierry
dc.contributor.authorPetry, Jasmine
dc.contributor.authorRichard, Olivier
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-14T21:16:53Z
dc.date.available2021-10-14T21:16:53Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6140
dc.sourceIIOimport
dc.titleTOFSIMS investigation of ZrAlO oxide layers
dc.typeOral presentation
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.source.peerreviewno
dc.source.conference3rd European Workshop on Secondary Ion Mass Spectrometry - SIMS Europe
dc.source.conferencedate15/09/2002
dc.source.conferencelocationMünster Germany
imec.availabilityPublished - imec


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