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A comparison of extraction techniques for threshold voltage mismatch

dc.contributor.authorCroon, Jeroen
dc.contributor.authorTuinhout, Hans
dc.contributor.authorDifrenza, R.
dc.contributor.authorKnol, J.
dc.contributor.authorMoonen, A.J.
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorMaes, Herman
dc.contributor.authorSansen, Willy
dc.date.accessioned2021-10-14T21:18:28Z
dc.date.available2021-10-14T21:18:28Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6158
dc.sourceIIOimport
dc.titleA comparison of extraction techniques for threshold voltage mismatch
dc.typeProceedings paper
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage235
dc.source.endpage240
dc.source.conferenceInternational Conference on Microelectronic Test Structures
dc.source.conferencedate8/04/2002
dc.source.conferencelocationCork Ireland
imec.availabilityPublished - imec


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