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dc.contributor.authorCubaynes, Florence
dc.contributor.authorDachs, Charles
dc.contributor.authorDetcheverry, Celine
dc.contributor.authorZegers, A.
dc.contributor.authorVenezia, Vincent
dc.contributor.authorSchmitz, Jurriaan
dc.contributor.authorStolk, Peter
dc.contributor.authorJurczak, Gosia
dc.contributor.authorHenson, Kirklen
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRothschild, Aude
dc.contributor.authorConard, Thierry
dc.contributor.authorPétry, Jasmine
dc.contributor.authorDa Rold, Martina
dc.contributor.authorSchaekers, Marc
dc.contributor.authorBadenes, Gonçal
dc.contributor.authorDate, L.
dc.contributor.authorPique, D.
dc.contributor.authorAl-Shareef, H.
dc.contributor.authorMurto, R.
dc.date.accessioned2021-10-14T21:18:48Z
dc.date.available2021-10-14T21:18:48Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6161
dc.sourceIIOimport
dc.titleGate dielectrics for high performance and low power CMOS SoC applications
dc.typeProceedings paper
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorSchaekers, Marc
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecSchaekers, Marc::0000-0002-1496-7816
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage427
dc.source.endpage430
dc.source.conferenceESSDERC - 32nd European Solid-State Device Research Conference
dc.source.conferencedate24/09/2002
dc.source.conferencelocationFirenze Italy
imec.availabilityPublished - open access


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