dc.contributor.author | Czerwinski, A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Poyai, Amporn | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-14T21:19:16Z | |
dc.date.available | 2021-10-14T21:19:16Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6166 | |
dc.source | IIOimport | |
dc.title | New method for accurate determination of the electric-field enhancement in junctions - theoretical model and application to STI diodes with high fields | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 278 | |
dc.source.endpage | 289 | |
dc.source.conference | High Purity Silicon VII | |
dc.source.conferencedate | 20/10/2002 | |
dc.source.conferencelocation | Salt Lake City, UT USA | |
imec.availability | Published - imec | |
imec.internalnotes | Electrochemical Society Series Proceedings; PV 2002-20 | |