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Reliability and failure analysis of RF MEMS switches
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Authors
De Wolf, Ingrid
;
van Spengen, Merlijn
;
Modlinski, Robert
;
Jourdain, Anne
;
Witvrouw, Ann
;
Fiorini, Paolo
;
Tilmans, Harrie
Conference
Proceedings 28th International Symposium for Testing and Failure Analysis - ISTFA
Title
Reliability and failure analysis of RF MEMS switches
Publication type
Proceedings paper
Embargo date
9999-12-31
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