dc.contributor.author | Goffioul, Michael | |
dc.contributor.author | Wambacq, Piet | |
dc.contributor.author | Vandersteen, Gerd | |
dc.contributor.author | Donnay, Stephane | |
dc.date.accessioned | 2021-10-14T21:43:11Z | |
dc.date.available | 2021-10-14T21:43:11Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6363 | |
dc.source | IIOimport | |
dc.title | Analysis of nonlinearities in RF front-end architectures using a modified Volterra series approach | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Wambacq, Piet | |
dc.contributor.imecauthor | Vandersteen, Gerd | |
dc.contributor.imecauthor | Donnay, Stephane | |
dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
dc.contributor.orcidimec | Donnay, Stephane::0000-0003-2489-4793 | |
dc.source.peerreview | no | |
dc.source.beginpage | 352 | |
dc.source.endpage | 356 | |
dc.source.conference | Proceedings of the Design Automation and Test in Europe Conference and Exhibition - DATE | |
dc.source.conferencedate | 4/03/2002 | |
dc.source.conferencelocation | Paris France | |
imec.availability | Published - imec | |