Show simple item record

Enhanced tunneling current effect for nonvolatile memory applications

dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorBlomme, Pieter
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-14T21:43:37Z
dc.date.available2021-10-14T21:43:37Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6366
dc.sourceIIOimport
dc.titleEnhanced tunneling current effect for nonvolatile memory applications
dc.typeProceedings paper
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage154
dc.source.endpage155
dc.source.conferenceExtended Abstracts of the International Conference on Solid State Devices - SSDM
dc.source.conferencedate17/09/2002
dc.source.conferencelocationNagoya Japan
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record