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Radiation damage in deep submicron MOSFETs by high-temperature electron irradiation
Publication:
Radiation damage in deep submicron MOSFETs by high-temperature electron irradiation
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Date
2002
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hayama, K.
;
Ohyama, H.
;
Takakura, K.
;
Simoen, Eddy
;
Poyai, Amporn
;
Claeys, Cor
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1943
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-16
Citations
Metrics
Views
1943
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-16
Citations