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Depth Resolution and Ripple Formation on AlxGa 1-xAs

dc.contributor.authorElst, Kathy
dc.contributor.authorTian, Chunsheng
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorAdams, F.
dc.date.accessioned2021-09-29T13:06:15Z
dc.date.available2021-09-29T13:06:15Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/642
dc.sourceIIOimport
dc.titleDepth Resolution and Ripple Formation on AlxGa 1-xAs
dc.typeOral presentation
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.conference10th International Conference on Secondary Ion Mass Spectrometry (SIMS X); October 1-6, 1995; Münster, Germany.
dc.source.conferencelocation
imec.availabilityPublished - imec


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