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dc.contributor.authorKeppens, Bart
dc.contributor.authorDe Heyn, Vincent
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-14T22:00:24Z
dc.date.available2021-10-14T22:00:24Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6469
dc.sourceIIOimport
dc.titleSignificance of the failure criterion on transmission line pulse testing
dc.typeJournal article
dc.contributor.imecauthorDe Heyn, Vincent
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.beginpage901
dc.source.endpage907
dc.source.journalMicroelectronics Reliability
dc.source.issue6
dc.source.volume42
imec.availabilityPublished - imec


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