Significance of the failure criterion on transmission line pulse testing

Metadata

Show full item record

Authors

Keppens, Bart; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Groeseneken, Guido

Issue

6

Journal

Microelectronics Reliability

Volume

42

Title

Significance of the failure criterion on transmission line pulse testing

Publication type

Journal article

Collections

Articles