Publication:
Significance of the failure criterion on transmission line pulse testing
Date
| dc.contributor.author | Keppens, Bart | |
| dc.contributor.author | De Heyn, Vincent | |
| dc.contributor.author | Mahadeva Iyer, Natarajan | |
| dc.contributor.author | Vassilev, Vesselin | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | De Heyn, Vincent | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-14T22:00:24Z | |
| dc.date.available | 2021-10-14T22:00:24Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6469 | |
| dc.source.beginpage | 901 | |
| dc.source.endpage | 907 | |
| dc.source.issue | 6 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 42 | |
| dc.title | Significance of the failure criterion on transmission line pulse testing | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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