Fine pitch copper wire bonding on copper bond pad process optimization
dc.contributor.author | Lam, Kan Wai | |
dc.contributor.author | Ho, Meng | |
dc.contributor.author | Stoukatch, Serguei | |
dc.contributor.author | Ratchev, Petar | |
dc.contributor.author | Vath, C.J. | |
dc.contributor.author | Schervan, A. | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-14T22:07:44Z | |
dc.date.available | 2021-10-14T22:07:44Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6512 | |
dc.source | IIOimport | |
dc.title | Fine pitch copper wire bonding on copper bond pad process optimization | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.source.peerreview | no | |
dc.source.beginpage | 63 | |
dc.source.endpage | 68 | |
dc.source.conference | 4th International Symposium on Electronic Materials and Packaging | |
dc.source.conferencedate | 3/12/2002 | |
dc.source.conferencelocation | Kaohsiung Taiwan | |
imec.availability | Published - imec |
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