dc.contributor.author | Le, Quoc Toan | |
dc.contributor.author | Vervoort, Iwan | |
dc.contributor.author | Caluwaerts, Rudy | |
dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Vanhaeren, Danielle | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-14T22:10:52Z | |
dc.date.available | 2021-10-14T22:10:52Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6530 | |
dc.source | IIOimport | |
dc.title | Preparation and characterization of electrochemically deposited copper alloys | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Le, Quoc Toan | |
dc.contributor.imecauthor | Caluwaerts, Rudy | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Vanhaeren, Danielle | |
dc.contributor.imecauthor | Maex, Karen | |
dc.contributor.orcidimec | Le, Quoc Toan::0000-0002-0206-6279 | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.contributor.orcidimec | Vanhaeren, Danielle::0000-0001-8624-9533 | |
dc.source.peerreview | no | |
dc.source.beginpage | 191 | |
dc.source.endpage | 196 | |
dc.source.conference | Advanced Metallization Conference 2001 | |
dc.source.conferencedate | 9/10/2001 | |
dc.source.conferencelocation | Montreal Canada | |
imec.availability | Published - imec | |
imec.internalnotes | Conference Proceedings ULSI XVII | |