The 1/f1.7 noise in submicron SOI MOSFETs with 2.5 nm nitrided oxide

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Authors

Lukyanchikova, N.; Petrichuk, M.; Garbar, N.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor; van Meer, Hans; De Meyer, Kristin

Issue

12

Journal

IEEE Trans. Electron Devices

Volume

49

Title

The 1/f1.7 noise in submicron SOI MOSFETs with 2.5 nm nitrided oxide

Publication type

Journal article

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