Show simple item record

Impacts of quantum effects on linear characteristics and low frequency noise in ultra thin gate oxide deep submicron MOSFETs

dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T22:22:54Z
dc.date.available2021-10-14T22:22:54Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6596
dc.sourceIIOimport
dc.titleImpacts of quantum effects on linear characteristics and low frequency noise in ultra thin gate oxide deep submicron MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage55
dc.source.endpage60
dc.source.conferenceProceedings of the 5th Annual Workshop on Semiconductor Advances for Future Electronics - SAFE
dc.source.conferencedate27/11/2002
dc.source.conferencelocationVeldhoven The Netherlands
imec.availabilityPublished - imec
imec.internalnotes


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record