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Inversion layer quantization impact on the interpretation of 1/f noise in deep submicron CMOS transistors

dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRichardson, Geoffrey
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T22:23:05Z
dc.date.available2021-10-14T22:23:05Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6597
dc.sourceIIOimport
dc.titleInversion layer quantization impact on the interpretation of 1/f noise in deep submicron CMOS transistors
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage79
dc.source.endpage82
dc.source.conferenceESSDERC - 32nd European Solid-State Device Research Conference
dc.source.conferencedate24/09/2002
dc.source.conferencelocationFirenze Italy
imec.availabilityPublished - open access


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