High-NA ArF lithography for 70-nm technologies
dc.contributor.author | Montgomery, Patrick | |
dc.contributor.author | Vandenberghe, Geert | |
dc.contributor.author | Lucas, Kevin | |
dc.date.accessioned | 2021-10-14T22:27:51Z | |
dc.date.available | 2021-10-14T22:27:51Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6622 | |
dc.source | IIOimport | |
dc.title | High-NA ArF lithography for 70-nm technologies | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandenberghe, Geert | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1613 | |
dc.source.endpage | 1624 | |
dc.source.conference | Optical Microlithography XV | |
dc.source.conferencedate | 5/03/2002 | |
dc.source.conferencelocation | Santa Clara, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; Vol. 4691 |