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Impact of high-temperature electron irradiation on the electrical parameters of n-type CZ silicon

dc.contributor.authorNeimash, V.
dc.contributor.authorKraitshinskii, A.
dc.contributor.authorKras'ko, N.
dc.contributor.authorTischenko, V.
dc.contributor.authorVoitovych, V.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T22:31:16Z
dc.date.available2021-10-14T22:31:16Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6639
dc.sourceIIOimport
dc.titleImpact of high-temperature electron irradiation on the electrical parameters of n-type CZ silicon
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage336
dc.source.endpage346
dc.source.conferenceHigh Purity Silicon VII
dc.source.conferencedate20/10/2002
dc.source.conferencelocationSalt Lake City, UT USA
imec.availabilityPublished - imec
imec.internalnotesElectrochemical Society Series Proceedings; PV 2002-20


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