Radiation damages in STI diodes after high temperature electron-irradiation
dc.contributor.author | Ohyama, H. | |
dc.contributor.author | Hayama, K. | |
dc.contributor.author | Takakura, K. | |
dc.contributor.author | Miura, T. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Poyai, Amporn | |
dc.contributor.author | Takami, Y. | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-14T22:34:17Z | |
dc.date.available | 2021-10-14T22:34:17Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6654 | |
dc.source | IIOimport | |
dc.title | Radiation damages in STI diodes after high temperature electron-irradiation | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.conference | RADECS Workshop | |
dc.source.conferencedate | 19/09/2002 | |
dc.source.conferencelocation | Padova Italy | |
imec.availability | Published - imec |
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