Show simple item record

Radiation damage of MOSFETs by high-temperature electron irradiation

dc.contributor.authorOhyama, H.
dc.contributor.authorHayama, K.
dc.contributor.authorTakakura, K.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T22:34:39Z
dc.date.available2021-10-14T22:34:39Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6656
dc.sourceIIOimport
dc.titleRadiation damage of MOSFETs by high-temperature electron irradiation
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1287
dc.source.endpage1290
dc.source.conferenceProceedings International Conference on Electrical Engineering
dc.source.conferencedate7/07/2002
dc.source.conferencelocationJeju Korea
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record