Radiation damage of MOSFETs by high-temperature electron irradiation
dc.contributor.author | Ohyama, H. | |
dc.contributor.author | Hayama, K. | |
dc.contributor.author | Takakura, K. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-14T22:34:39Z | |
dc.date.available | 2021-10-14T22:34:39Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6656 | |
dc.source | IIOimport | |
dc.title | Radiation damage of MOSFETs by high-temperature electron irradiation | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1287 | |
dc.source.endpage | 1290 | |
dc.source.conference | Proceedings International Conference on Electrical Engineering | |
dc.source.conferencedate | 7/07/2002 | |
dc.source.conferencelocation | Jeju Korea | |
imec.availability | Published - imec |
Files in this item
Files | Size | Format | View |
---|---|---|---|
There are no files associated with this item. |