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Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorBellens, Rudi
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T13:06:57Z
dc.date.available2021-09-29T13:06:57Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/665
dc.sourceIIOimport
dc.titleHot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.source.peerreviewno
dc.source.beginpage1208
dc.source.endpage1220
dc.source.journalSemiconductor Science and Technology
dc.source.issue9
dc.source.volume10
imec.availabilityPublished - imec


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