Publication:
Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions
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2027 since deposited on 2021-09-29
1last month
Acq. date: 2026-01-07
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Metrics
Views
2027 since deposited on 2021-09-29
1last month
Acq. date: 2026-01-07
Citations