Publication:
Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions
Date
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Bellens, Rudi | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Maes, Herman | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.date.accessioned | 2021-09-29T13:06:57Z | |
| dc.date.available | 2021-09-29T13:06:57Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/665 | |
| dc.source.beginpage | 1208 | |
| dc.source.endpage | 1220 | |
| dc.source.issue | 9 | |
| dc.source.journal | Semiconductor Science and Technology | |
| dc.source.volume | 10 | |
| dc.title | Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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