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Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions

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2038 since deposited on 2021-09-29
4last month
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Acq. date: 2026-03-17

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2038 since deposited on 2021-09-29
4last month
1last week
Acq. date: 2026-03-17

Citations