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A model for the radiation degradation of polycrystalline silicon films

dc.contributor.authorOhyama, H.
dc.contributor.authorNakabayashi, M.
dc.contributor.authorTakakura, K.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorTakami, Y.
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T22:35:28Z
dc.date.available2021-10-14T22:35:28Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6660
dc.sourceIIOimport
dc.titleA model for the radiation degradation of polycrystalline silicon films
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceRADECS Workshop
dc.source.conferencedate19/09/2002
dc.source.conferencelocationPadova Italy
imec.availabilityPublished - imec


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