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Radiation damage of Si photodiodes by high-temperature irradiation

dc.contributor.authorOhyama, H.
dc.contributor.authorTakakura, T.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorUemura, J.
dc.contributor.authorKishikawa, T.
dc.date.accessioned2021-10-14T22:36:03Z
dc.date.available2021-10-14T22:36:03Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6663
dc.sourceIIOimport
dc.titleRadiation damage of Si photodiodes by high-temperature irradiation
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference8th International Conference on Electronic Materials - IUMRS-ICEM
dc.source.conferencedate10/06/2002
dc.source.conferencelocationXi'an China
imec.availabilityPublished - imec


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