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Radiation damage in Si photodiodes by high temperature irradiation

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorTakakura, K.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorUemura, J.
dc.contributor.authorKishikawa, T.
dc.contributor.authorKobayashi, K.
dc.date.accessioned2021-10-14T22:37:20Z
dc.date.available2021-10-14T22:37:20Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6669
dc.sourceIIOimport
dc.titleRadiation damage in Si photodiodes by high temperature irradiation
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceE-MRS Spring Meeting Symposium H: Si-based Optronics: Advances and Future Perspectives
dc.source.conferencedate18/06/2002
dc.source.conferencelocationStrasbourg France
imec.availabilityPublished - imec


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