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Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology

dc.contributor.authorPetersen, R.
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorD'Haen, Jan
dc.contributor.authorD'Olieslaeger, Marc
dc.contributor.authorDe Schepper, Luc
dc.contributor.authorVendier, O.
dc.contributor.authorBlanck, H.
dc.contributor.authorPons, D.
dc.date.accessioned2021-10-14T22:44:57Z
dc.date.available2021-10-14T22:44:57Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6707
dc.sourceIIOimport
dc.titleExploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology
dc.typeJournal article
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorD'Haen, Jan
dc.contributor.imecauthorD'Olieslaeger, Marc
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1359
dc.source.endpage1363
dc.source.journalMicroelectronics Reliability
dc.source.issue9_11
dc.source.volume42
imec.availabilityPublished - open access
imec.internalnotes13th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF; October 2002; Rimini, Italy


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