Authors

Petersen, R.; De Ceuninck, Ward; D'Haen, Jan; D'Olieslaeger, Marc; De Schepper, Luc; Vendier, O.; Blanck, H.; Pons, D.

Issue

9_11

Journal

Microelectronics Reliability

Volume

42

Title

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology

Publication type

Journal article

Embargo date

9999-12-31