Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology

dc.contributor.author	Petersen, R.
dc.contributor.author	De Ceuninck, Ward
dc.contributor.author	D'Haen, Jan
dc.contributor.author	D'Olieslaeger, Marc
dc.contributor.author	De Schepper, Luc
dc.contributor.author	Vendier, O.
dc.contributor.author	Blanck, H.
dc.contributor.author	Pons, D.
dc.contributor.imecauthor	De Ceuninck, Ward
dc.contributor.imecauthor	D'Haen, Jan
dc.contributor.imecauthor	D'Olieslaeger, Marc
dc.date.accessioned	2021-10-14T22:44:57Z
dc.date.available	2021-10-14T22:44:57Z
dc.date.embargo	9999-12-31
dc.date.issued	2002
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/6707
dc.source.beginpage	1359
dc.source.endpage	1363
dc.source.issue	9_11
dc.source.journal	Microelectronics Reliability
dc.source.volume	42
dc.title	Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology
dc.type	Journal article
dspace.entity.type	Publication
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