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Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology
Publication:
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology
Date
2002
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Petersen, R.
;
De Ceuninck, Ward
;
D'Haen, Jan
;
D'Olieslaeger, Marc
;
De Schepper, Luc
;
Vendier, O.
;
Blanck, H.
;
Pons, D.
Journal
Microelectronics Reliability
Abstract
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2058
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations
Metrics
Views
2058
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations