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Effect of shallow junction on the extraction of the minority carrier recombination lifetime from forward diode characteristics

dc.contributor.authorPoyai, Amporn
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorGaubas, Eugenijus
dc.date.accessioned2021-10-14T22:51:18Z
dc.date.available2021-10-14T22:51:18Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6738
dc.sourceIIOimport
dc.titleEffect of shallow junction on the extraction of the minority carrier recombination lifetime from forward diode characteristics
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpageCM1-14
dc.source.conferenceBelgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting
dc.source.conferencedate5/06/2002
dc.source.conferencelocationLiège Belgium
imec.availabilityPublished - imec


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