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Extraction of the carrier generation and recombination lifetime from the forward characteristics of advanced diodes

dc.contributor.authorPoyai, Amporn
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorHuber, A.
dc.contributor.authorGräf, D.
dc.date.accessioned2021-10-14T22:51:30Z
dc.date.available2021-10-14T22:51:30Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6739
dc.sourceIIOimport
dc.titleExtraction of the carrier generation and recombination lifetime from the forward characteristics of advanced diodes
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conferenceE-MRS Spring Meeting Symposium E: Advanced Characterisation of Semiconductor Materials and Devices
dc.source.conferencedate18/06/2002
dc.source.conferencelocationStrasbourg France
imec.availabilityPublished - imec


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