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ESD reliability issues in RF CMOS circuits

dc.contributor.authorRadhakrishnan, M. K.
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorKeppens, Bart
dc.contributor.authorDe Heyn, Vincent
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-14T22:53:37Z
dc.date.available2021-10-14T22:53:37Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6749
dc.sourceIIOimport
dc.titleESD reliability issues in RF CMOS circuits
dc.typeProceedings paper
dc.contributor.imecauthorDe Heyn, Vincent
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage551
dc.source.endpage556
dc.source.conferenceProceedings of the International Workshop on Semiconductor devices
dc.source.conferencedate11/12/2001
dc.source.conferencelocationDelhi India
imec.availabilityPublished - open access


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