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In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror
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In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror
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Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Roebben, G.
;
Zhao, Chao
;
Duan, R. G.
;
Vleugels, J.
;
Heyns, Marc
;
Van Der Biest, O.
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1895
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations
Metrics
Views
1895
since deposited on 2021-10-14
Acq. date: 2025-12-10
Citations