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In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror

dc.contributor.authorRoebben, G.
dc.contributor.authorZhao, Chao
dc.contributor.authorDuan, R. G.
dc.contributor.authorVleugels, J.
dc.contributor.authorHeyns, Marc
dc.contributor.authorVan Der Biest, O.
dc.date.accessioned2021-10-14T22:56:13Z
dc.date.available2021-10-14T22:56:13Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6761
dc.sourceIIOimport
dc.titleIn-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror
dc.typeProceedings paper
dc.contributor.imecauthorHeyns, Marc
dc.source.peerreviewno
dc.source.beginpage775
dc.source.endpage778
dc.source.conferenceEuro Ceramics VII, Pt 1-3
dc.source.conferencedate9/09/2001
dc.source.conferencelocationBrugge Belgium
imec.availabilityPublished - imec
imec.internalnotesKey Engineering Materials; Vol. 206-213


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