dc.contributor.author | Schuler, Franz | |
dc.contributor.author | Tempel, Georg | |
dc.contributor.author | Melzner, H. | |
dc.contributor.author | Jacob, M. | |
dc.contributor.author | Hendrickx, Paul | |
dc.contributor.author | Wellekens, Dirk | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2021-10-14T23:07:19Z | |
dc.date.available | 2021-10-14T23:07:19Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6813 | |
dc.source | IIOimport | |
dc.title | Failure rate prediction and accelerated detection of anomalous charge loss in flash memories by using an analytical transient physics-based charge loss model | |
dc.type | Journal article | |
dc.contributor.imecauthor | Hendrickx, Paul | |
dc.contributor.imecauthor | Wellekens, Dirk | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.source.peerreview | no | |
dc.source.beginpage | 2650 | |
dc.source.endpage | 2653 | |
dc.source.journal | Japanese Journal of Applied Physics. Part 1 | |
dc.source.issue | 4B | |
dc.source.volume | 41 | |
imec.availability | Published - imec | |