Authors

Schuler, Franz; Tempel, Georg; Melzner, H.; Jacob, M.; Hendrickx, Paul; Wellekens, Dirk; Van Houdt, Jan

Issue

4B

Journal

Japanese Journal of Applied Physics. Part 1

Volume

41

Title

Failure rate prediction and accelerated detection of anomalous charge loss in flash memories by using an analytical transient physics-based charge loss model

Publication type

Journal article