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Optical calibration of electron concentrations in heavily doped GaAs films

dc.contributor.authorStiens, J.
dc.contributor.authorKotov, V.
dc.contributor.authorShkerdin, G.
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorVounckx, Roger
dc.date.accessioned2021-10-14T23:15:47Z
dc.date.available2021-10-14T23:15:47Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6852
dc.sourceIIOimport
dc.titleOptical calibration of electron concentrations in heavily doped GaAs films
dc.typeProceedings paper
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorVounckx, Roger
dc.source.peerreviewno
dc.source.beginpage459
dc.source.endpage462
dc.source.conferenceConference on Optoelectronic and Microelectronic Materials and Devices - COMMAD
dc.source.conferencedate11/12/2002
dc.source.conferencelocationSydney Australia
imec.availabilityPublished - imec


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