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ASIC for temperature monitoring in IPM with VDMOS transistors

dc.contributor.authorSzczepaniak, Z.
dc.contributor.authorWiderski, T.
dc.contributor.authorSibinski, M.
dc.contributor.authorNogawski, A.
dc.contributor.authorDe Vos, Alexis
dc.contributor.authorLisik, S.
dc.date.accessioned2021-10-14T23:18:07Z
dc.date.available2021-10-14T23:18:07Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6863
dc.sourceIIOimport
dc.titleASIC for temperature monitoring in IPM with VDMOS transistors
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage195
dc.source.endpage197
dc.source.conferenceProceedings of the 17th Symposium on Electromagnetic Phenomena in Nonlinear Circuits - EPNC
dc.source.conferencedate1/07/2002
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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