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Physical failure analysis to distinguish EOS and ESD failures
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Authors
Tung, Chih Hang
;
Cheng, Cheng Kou
;
Radhakrishnan, M.K.
;
Mahadeva Iyer, Natarajan
Conference
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA
Title
Physical failure analysis to distinguish EOS and ESD failures
Publication type
Proceedings paper
Embargo date
9999-12-31
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