Relation between microstructure and 2DEG properties in AlGaN/GaN structures
dc.contributor.author | Van Daele, B. | |
dc.contributor.author | Van Tendeloo, G. | |
dc.contributor.author | Germain, Marianne | |
dc.contributor.author | Leys, Maarten | |
dc.contributor.author | Bougrioua, Z. | |
dc.contributor.author | Moerman, Ingrid | |
dc.date.accessioned | 2021-10-14T23:29:22Z | |
dc.date.available | 2021-10-14T23:29:22Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6914 | |
dc.source | IIOimport | |
dc.title | Relation between microstructure and 2DEG properties in AlGaN/GaN structures | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Moerman, Ingrid | |
dc.contributor.orcidimec | Moerman, Ingrid::0000-0003-2377-3674 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 315 | |
dc.source.conference | International Workshop on Nitride Semiconductors | |
dc.source.conferencedate | 22/07/2002 | |
dc.source.conferencelocation | Aachen Germany | |
imec.availability | Published - open access |