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Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited

dc.contributor.authorJanssens, Koenraad
dc.contributor.authorVan Der Biest, O.
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorMaes, Herman
dc.contributor.authorHull, R.
dc.date.accessioned2021-09-29T13:07:54Z
dc.date.available2021-09-29T13:07:54Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/692
dc.sourceIIOimport
dc.titleStrain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conferenceEMSA; August 1995;
dc.source.conferencelocation
imec.availabilityPublished - imec


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