Show simple item record

Using reduced-order models in D/A converter testing

dc.contributor.authorVargha, B.
dc.contributor.authorSchoukens, J.
dc.contributor.authorRolain, Y.
dc.date.accessioned2021-10-14T23:49:53Z
dc.date.available2021-10-14T23:49:53Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7005
dc.sourceIIOimport
dc.titleUsing reduced-order models in D/A converter testing
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage701
dc.source.endpage706
dc.source.conferenceProceedings of the 19th IEEE Instrumentation and Measurement Technology Conference
dc.source.conferencedate21/05/2002
dc.source.conferencelocationAnchorage, AK USA
imec.availabilityPublished - open access
imec.internalnotesVol.1


Files in this item

Thumbnail
Name:
7058.pdf
Size:
591.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record