Using reduced-order models in D/A converter testing
dc.contributor.author | Vargha, B. | |
dc.contributor.author | Schoukens, J. | |
dc.contributor.author | Rolain, Y. | |
dc.date.accessioned | 2021-10-14T23:49:53Z | |
dc.date.available | 2021-10-14T23:49:53Z | |
dc.date.issued | 2002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7005 | |
dc.source | IIOimport | |
dc.title | Using reduced-order models in D/A converter testing | |
dc.type | Proceedings paper | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 701 | |
dc.source.endpage | 706 | |
dc.source.conference | Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference | |
dc.source.conferencedate | 21/05/2002 | |
dc.source.conferencelocation | Anchorage, AK USA | |
imec.availability | Published - open access | |
imec.internalnotes | Vol.1 |