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Active laser characterization by scanning capacitance microscopy

dc.contributor.authorXu, Mingwei
dc.contributor.authorDuhayon, Natasja
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-15T00:05:13Z
dc.date.available2021-10-15T00:05:13Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7068
dc.sourceIIOimport
dc.titleActive laser characterization by scanning capacitance microscopy
dc.typeProceedings paper
dc.contributor.imecauthorDuhayon, Natasja
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.beginpage173
dc.source.endpage175
dc.source.conferenceGaAs-MANTECH Conference. Digest of Papers
dc.source.conferencedate8/04/2002
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec


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