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Characterisation of the overlap capacitance of submicron LDD MOSFETs

dc.contributor.authorKol'dyaev, Victor
dc.contributor.authorClerix, Andre
dc.contributor.authorMurphy, Roberto
dc.contributor.authorDeferm, Ludo
dc.date.accessioned2021-09-29T13:08:31Z
dc.date.available2021-09-29T13:08:31Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/707
dc.sourceIIOimport
dc.titleCharacterisation of the overlap capacitance of submicron LDD MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorClerix, Andre
dc.contributor.imecauthorDeferm, Ludo
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage757
dc.source.endpage760
dc.source.conference25th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate25/09/1995
dc.source.conferencelocationDen Haag The Netherlands
imec.availabilityPublished - open access


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