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CoSi2Si1-xGx-interfaces for Schottky barrier infrared detectors with extended detection regime

dc.contributor.authorKolodinski, Sabine
dc.contributor.authorAlves Donaton, Ricardo
dc.contributor.authorRoca, Elisenda
dc.contributor.authorCaymax, Matty
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-09-29T13:08:33Z
dc.date.available2021-09-29T13:08:33Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/708
dc.sourceIIOimport
dc.titleCoSi2Si1-xGx-interfaces for Schottky barrier infrared detectors with extended detection regime
dc.typeProceedings paper
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMaex, Karen
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage175
dc.source.endpage84
dc.source.conferenceGrowth and Characterization of Materials for Infrared Detectors II
dc.source.conferencedate13/07/1995
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 2554


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