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High resolution electrical characterization of laterally overgrown epitaxial InP

dc.contributor.authorAnand, S.
dc.contributor.authorSun, Y.T.
dc.contributor.authorLourdudoss, S.
dc.contributor.authorXu, Mingwei
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-15T03:58:48Z
dc.date.available2021-10-15T03:58:48Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7134
dc.sourceIIOimport
dc.titleHigh resolution electrical characterization of laterally overgrown epitaxial InP
dc.typeProceedings paper
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.beginpage563
dc.source.endpage566
dc.source.conference15th International Conference on Indium Phosphide and Related Materials - IPRM
dc.source.conferencedate12/05/2003
dc.source.conferencelocationSanta Barbara USA
imec.availabilityPublished - imec


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