dc.contributor.author | Anghel, C. | |
dc.contributor.author | Hefyene, N. | |
dc.contributor.author | Vermandel, Miguel | |
dc.contributor.author | Bakeroot, Benoit | |
dc.contributor.author | Doutreloigne, Jan | |
dc.contributor.author | Gillon, R. | |
dc.contributor.author | Ionescu, A.M. | |
dc.date.accessioned | 2021-10-15T03:59:00Z | |
dc.date.available | 2021-10-15T03:59:00Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7144 | |
dc.source | IIOimport | |
dc.title | Electrical characterisation of high voltage MOSFETs using MESDRIFT | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bakeroot, Benoit | |
dc.contributor.imecauthor | Doutreloigne, Jan | |
dc.contributor.orcidimec | Bakeroot, Benoit::0000-0003-4392-1777 | |
dc.source.peerreview | no | |
dc.source.beginpage | 257 | |
dc.source.endpage | 260 | |
dc.source.conference | Proceedings International Semiconductor Conference | |
dc.source.conferencedate | 28/09/2003 | |
dc.source.conferencelocation | Sinaia Romania | |
imec.availability | Published - imec | |